Section 01
Introduction to the Dual-Path Comparative Study of Edge AI Anomaly Detection on STM32
This article conducts benchmark tests of predictive maintenance systems on resource-constrained STM32 microcontrollers for edge intelligence applications in the Industrial Internet of Things (IIoT), comparing two technical paths: static pre-trained models based on TensorFlow Lite and dynamic on-device learning solutions based on NanoEdge AI. The study evaluates from multiple dimensions such as accuracy, resource usage, energy consumption, and response latency, providing practical references for embedded AI developers.